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"Mapping patent classifications: portfolio and statistical analysis, and ..."
Loet Leydesdorff, Dieter Franz Kogler, Bowen Yan (2017)
- Loet Leydesdorff, Dieter Franz Kogler, Bowen Yan:
Mapping patent classifications: portfolio and statistical analysis, and the comparison of strengths and weaknesses. Scientometrics 112(3): 1573-1591 (2017)
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