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"Profitability decided by patent quality? An empirical study of the U.S. ..."

Yin-Hui Cheng et al. (2010)

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DOI: 10.1007/S11192-009-0080-4

access: closed

type: Journal Article

metadata version: 2020-07-17

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  - https://dblp.org/rec/journals/scientometrics/ChengKCK10
Yin-Hui Cheng, Fu-Yung Kuan, Shih-Chieh Chuang, Yun Ken:
Profitability decided by patent quality? An empirical study of the U.S. semiconductor industry. Scientometrics 82(1): 175-183 (2010)

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