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"Analysis of two-terminal network reliability based on efficient data ..."

Subhashis Chatterjee, Venkata Ramana, Gajendra K. Vishwakarma (2020)

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DOI: 10.1007/S13198-019-00921-7

access: closed

type: Journal Article

metadata version: 2021-07-25

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  - https://dblp.org/rec/journals/saem/ChatterjeeRV20
Subhashis Chatterjee, Venkata Ramana, Gajendra K. Vishwakarma:
Analysis of two-terminal network reliability based on efficient data structure. Int. J. Syst. Assur. Eng. Manag. 11(1): 15-20 (2020)

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