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"A truncated test scheme design method for success-failure in-orbit tests."

Wenzhe Ding et al. (2024)

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DOI: 10.1016/J.RESS.2023.109782

access: closed

type: Journal Article

metadata version: 2024-02-09

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  - https://dblp.org/rec/journals/ress/DingBWLLWLYY24
Wenzhe Ding, Xiang Bai, Qingwei Wang, Fang Long, Hailin Li, Zhengrong Wu, Jian Liu, Huisheng Yao, Hong Yang:
A truncated test scheme design method for success-failure in-orbit tests. Reliab. Eng. Syst. Saf. 243: 109782 (2024)

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