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"A new formalism that combines advantages of fault-trees and Markov models: ..."

Marc Bouissou, Jean-Louis Bon (2003)

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DOI: 10.1016/S0951-8320(03)00143-1

access: closed

type: Journal Article

metadata version: 2021-10-14

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Marc Bouissou, Jean-Louis Bon:
A new formalism that combines advantages of fault-trees and Markov models: Boolean logic driven Markov processes. Reliab. Eng. Syst. Saf. 82(2): 149-163 (2003)

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