"Optimal planning of step-stress accelerated degradation test based on ..."

Qian He et al. (2024)

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DOI: 10.1002/QRE.3561

access: closed

type: Journal Article

metadata version: 2024-09-24

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Qian He, Weian Yan, Weidong Liu, David Bigaud, Xiaofan Xu, Zitong Lei:
Optimal planning of step-stress accelerated degradation test based on Tweedie exponential dispersion process with random effects. Qual. Reliab. Eng. Int. 40(6): 2976-3000 (2024)

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