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"Optimum step-stress for temperature accelerated life testing."

Evans Gouno (2007)

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DOI: 10.1002/QRE.853

access: closed

type: Journal Article

metadata version: 2020-07-09

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Evans Gouno:
Optimum step-stress for temperature accelerated life testing. Qual. Reliab. Eng. Int. 23(8): 915-924 (2007)

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