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"Reliability analysis for electronic devices using beta-Weibull distribution."

Luis Carlos Méndez González et al. (2017)

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DOI: 10.1002/QRE.2214

access: closed

type: Journal Article

metadata version: 2020-07-09

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  - https://dblp.org/rec/journals/qre/GonzalezRVRQ17
Luis Carlos Méndez González, Luis Alberto Rodríguez-Picón, Delia J. Valles-Rosales, Roberto Romero-López, Abel Eduardo Quezada-Carreón:
Reliability analysis for electronic devices using beta-Weibull distribution. Qual. Reliab. Eng. Int. 33(8): 2521-2530 (2017)

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