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"Rethinking precision of pseudo label: Test-time adaptation via ..."

Longbin Zeng et al. (2024)

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DOI: 10.1016/J.PATREC.2023.12.001

access: closed

type: Journal Article

metadata version: 2024-02-29

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Longbin Zeng, Jiayi Han, Liang Du, Weiyang Ding:
Rethinking precision of pseudo label: Test-time adaptation via complementary learning. Pattern Recognit. Lett. 177: 96-102 (2024)

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