"Unsupervised spatial pattern classification of electrical-wafer-sorting ..."

Federico Di Palma et al. (2005)

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DOI: 10.1016/J.PATREC.2005.03.007

access: closed

type: Journal Article

metadata version: 2020-02-22

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Federico Di Palma, Giuseppe De Nicolao, Guido Miraglia, Egidio Pasquinetti, Francesco Piccinini:
Unsupervised spatial pattern classification of electrical-wafer-sorting maps in semiconductor manufacturing. Pattern Recognit. Lett. 26(12): 1857-1865 (2005)

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