"Corner detection via topographic analysis of vector-potential."

Bin Luo, Andrew D. J. Cross, Edwin R. Hancock (1999)

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DOI: 10.1016/S0167-8655(99)00028-8

access: closed

type: Journal Article

metadata version: 2020-02-22

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Bin Luo, Andrew D. J. Cross, Edwin R. Hancock:
Corner detection via topographic analysis of vector-potential. Pattern Recognit. Lett. 20(6): 635-650 (1999)

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