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"Polycrystalline silicon wafer defect segmentation based on deep ..."
Hui Han et al. (2020)
- Hui Han, Chenqiang Gao, Yue Zhao, Shisha Liao, Lin Tang, Xindou Li:
Polycrystalline silicon wafer defect segmentation based on deep convolutional neural networks. Pattern Recognit. Lett. 130: 234-241 (2020)
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