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"Editorial of the special issue TIAR: Topological image analysis and ..."

Hepzibah A. Christinal et al. (2020)

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DOI: 10.1016/J.PATREC.2020.06.012

access: closed

type: Journal Article

metadata version: 2023-03-21

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Hepzibah A. Christinal, Fernando Díaz-del-Río, Rebeca Marfil, Helena Molina-Abril, Darian Onchis-Moaca, Pedro Real:
Editorial of the special issue TIAR: Topological image analysis and recognition. Pattern Recognit. Lett. 136: 228-229 (2020)

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