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"An imaging approach for the automatic thresholding of photo defects."

Neelam Bhardwaj, Suneeta Agarwal, Vikash Bhardwaj (2015)

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DOI: 10.1016/J.PATREC.2015.03.019

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - journals/prl/BhardwajAB15
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  - https://dblp.org/rec/journals/prl/BhardwajAB15
Neelam Bhardwaj, Suneeta Agarwal, Vikash Bhardwaj:
An imaging approach for the automatic thresholding of photo defects. Pattern Recognit. Lett. 60-61: 32-40 (2015)

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