"Extending the relevant component analysis algorithm for metric learning ..."

Dit-Yan Yeung, Hong Chang (2006)

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DOI: 10.1016/J.PATCOG.2005.12.004

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type: Journal Article

metadata version: 2024-10-28

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Dit-Yan Yeung, Hong Chang:
Extending the relevant component analysis algorithm for metric learning using both positive and negative equivalence constraints. Pattern Recognit. 39(5): 1007-1010 (2006)

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