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"Accumulated and aggregated shifting of intensity for defect detection on ..."
Yaping Yan, Shun'ichi Kaneko, Hirokazu Asano (2020)
- Yaping Yan, Shun'ichi Kaneko, Hirokazu Asano:
Accumulated and aggregated shifting of intensity for defect detection on micro 3D textured surfaces. Pattern Recognit. 98 (2020)
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