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"Computer aided feature selection for enhanced analogue system fault location."

K. C. Varghese, J. Hywel Williams, Denis R. Towill (1978)

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DOI: 10.1016/0031-3203(78)90036-5

access: closed

type: Journal Article

metadata version: 2020-02-24

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  - https://dblp.org/rec/journals/pr/VargheseWT78
K. C. Varghese, J. Hywel Williams, Denis R. Towill:
Computer aided feature selection for enhanced analogue system fault location. Pattern Recognit. 10(4): 265-280 (1978)

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