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"Wavelet based methods on patterned fabric defect detection."
Henry Y. T. Ngan et al. (2005)
- Henry Y. T. Ngan, Grantham K. H. Pang, S. P. Yung, Michael Kwok-Po Ng:
Wavelet based methods on patterned fabric defect detection. Pattern Recognit. 38(4): 559-576 (2005)
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