"Reliability of HfO2-Based Ferroelectric FETs: A Critical Review ..."

Nicolò Zagni et al. (2023)

> Home

Details and statistics

DOI: 10.1109/JPROC.2023.3234607

access: closed

type: Journal Article

metadata version: 2023-03-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/pieee/ZagniPPA23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/pieee/ZagniPPA23
Nicolò Zagni, Francesco Maria Puglisi, Paolo Pavan, Muhammad Ashraful Alam:
Reliability of HfO₂-Based Ferroelectric FETs: A Critical Review of Current and Future Challenges. Proc. IEEE 111(2): 158-184 (2023)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.