"Defect-oriented testability for asynchronous ICs."

Marly Roncken (1999)

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DOI: 10.1109/5.740029

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type: Journal Article

metadata version: 2022-02-28

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Marly Roncken:
Defect-oriented testability for asynchronous ICs. Proc. IEEE 87(2): 363-375 (1999)

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