"Noise in SiGe HBT RF Technology: Physics, Modeling, and Circuit Implications."

Guofu Niu (2005)

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DOI: 10.1109/JPROC.2005.852226

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type: Journal Article

metadata version: 2020-10-02

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Guofu Niu:
Noise in SiGe HBT RF Technology: Physics, Modeling, and Circuit Implications. Proc. IEEE 93(9): 1583-1597 (2005)

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