"LotTrack: RFID-Based Process Control in the Semiconductor Industry."

Frédéric Thiesse, Markus Dierkes, Elgar Fleisch (2006)

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DOI: 10.1109/MPRV.2006.9

access: closed

type: Journal Article

metadata version: 2020-03-31

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  - https://dblp.org/rec/journals/pervasive/ThiesseDF06
Frédéric Thiesse, Markus Dierkes, Elgar Fleisch:
LotTrack: RFID-Based Process Control in the Semiconductor Industry. IEEE Pervasive Comput. 5(1): 47-53 (2006)

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