"Contrastive Bayesian Analysis for Deep Metric Learning."

Shichao Kan et al. (2023)

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DOI: 10.1109/TPAMI.2022.3221486

access: closed

type: Journal Article

metadata version: 2023-06-02

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Shichao Kan, Zhiquan He, Yigang Cen, Yang Li, Vladimir Mladenovic, Zhihai He:
Contrastive Bayesian Analysis for Deep Metric Learning. IEEE Trans. Pattern Anal. Mach. Intell. 45(6): 7220-7238 (2023)

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