"Seeing Behind the Scene: Analysis of Photometric Properties of Occluding ..."

Naoki Asada, Hisanaga Fujiwara, Takashi Matsuyama (1998)

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DOI: 10.1109/34.659933

access: closed

type: Journal Article

metadata version: 2017-05-17

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  - https://dblp.org/rec/journals/pami/AsadaFM98
Naoki Asada, Hisanaga Fujiwara, Takashi Matsuyama:
Seeing Behind the Scene: Analysis of Photometric Properties of Occluding Edges by the Reversed Projection Blurring Model. IEEE Trans. Pattern Anal. Mach. Intell. 20(2): 155-167 (1998)

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