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"Defect detection using feature point matching for non-repetitive patterned ..."

Hye Won Kim, Suk I. Yoo (2014)

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DOI: 10.1007/S10044-012-0305-7

access: closed

type: Journal Article

metadata version: 2017-05-20

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Hye Won Kim, Suk I. Yoo:
Defect detection using feature point matching for non-repetitive patterned images. Pattern Anal. Appl. 17(2): 415-429 (2014)

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