"Pattern classification using principal components of cortical thickness ..."

Uicheul Yoon et al. (2007)

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DOI: 10.1016/J.NEUROIMAGE.2006.11.021

access: closed

type: Journal Article

metadata version: 2018-11-30

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  - https://dblp.org/rec/journals/neuroimage/YoonLISCKKK07
Uicheul Yoon, Jong-Min Lee, Kiho Im, Yong-Wook Shin, Baek Hwan Cho, In-Young Kim, Jun Soo Kwon, Sun I. Kim:
Pattern classification using principal components of cortical thickness and its discriminative pattern in schizophrenia. NeuroImage 34(4): 1405-1415 (2007)

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