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"Reliability of dissimilarity measures for multi-voxel pattern analysis."
Alexander Walther et al. (2016)
- Alexander Walther, Hamed Nili, Naveed Ejaz, Arjen Alink, Nikolaus Kriegeskorte, Jörn Diedrichsen:
Reliability of dissimilarity measures for multi-voxel pattern analysis. NeuroImage 137: 188-200 (2016)
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