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ORCID"Error Classification and Yield Prediction of Chips in Semiconductor ..."
L. Ludwig et al. (2000)
- L. Ludwig, Elena P. Sapozhnikova, V. P. Lunin, Wolfgang Rosenstiel:
Error Classification and Yield Prediction of Chips in Semiconductor Industry Applications. Neural Comput. Appl. 9(3): 202-210 (2000)
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