default search action
"Effect of 805 nm on reliability of 735/805/850-nm LED involved ..."
Yue Zhao et al. (2017)
- Yue Zhao, Lina Qiu, Ke Zhao, Kai Li, Yunlong Sun, Lingkang Meng, Zhe Huang, Ting Li:
Effect of 805 nm on reliability of 735/805/850-nm LED involved near-infrared spectroscopy biomedical device. Microelectron. Reliab. 78: 406-410 (2017)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.