"Analysis of time-dependent dielectric breakdown induced aging of SRAM ..."

Rui Zhang et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.06.040

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type: Journal Article

metadata version: 2022-01-03

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Rui Zhang, Taizhi Liu, Kexin Yang, Linda Milor:
Analysis of time-dependent dielectric breakdown induced aging of SRAM cache with different configurations. Microelectron. Reliab. 76-77: 87-91 (2017)

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