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"A cloud model-based method for the analysis of accelerated life test data."

Wenjin Zhang et al. (2015)

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DOI: 10.1016/J.MICROREL.2014.10.006

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/ZhangLSLP15
Wenjin Zhang, Shunli Liu, Bo Sun, Yue Liu, Michael G. Pecht:
A cloud model-based method for the analysis of accelerated life test data. Microelectron. Reliab. 55(1): 123-128 (2015)

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