"A new approach for Total Ionizing Dose effect analysis on Flash-based FPGA."

Qiutao Zhang et al. (2017)

Details and statistics

DOI: 10.1016/J.MICROREL.2017.07.066

access: closed

type: Journal Article

metadata version: 2021-10-14

a service of  Schloss Dagstuhl - Leibniz Center for Informatics