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"Method to estimate profile of threshold voltage degradation in MOSFETs due ..."

Yeohyeok Yun et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.055

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yeohyeok Yun, Ji-Hoon Seo, Donghee Son, Bongkoo Kang:
Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress. Microelectron. Reliab. 88-90: 186-190 (2018)

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