"Efficient statistical capacitance extraction of nanometer interconnects ..."

Wenjian Yu et al. (2012)

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DOI: 10.1016/J.MICROREL.2011.11.012

access: closed

type: Journal Article

metadata version: 2020-02-22

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Wenjian Yu, Qingqing Zhang, Zuochang Ye, Zuying Luo:
Efficient statistical capacitance extraction of nanometer interconnects considering the on-chip line edge roughness. Microelectron. Reliab. 52(4): 704-710 (2012)

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