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"Dynamic voltage stress effects on nMOS varactor."

Chuanzhao Yu, J. S. Yuan, Enjun Xiao (2006)

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DOI: 10.1016/J.MICROREL.2006.07.075

access: closed

type: Journal Article

metadata version: 2020-02-22

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Chuanzhao Yu, J. S. Yuan, Enjun Xiao:
Dynamic voltage stress effects on nMOS varactor. Microelectron. Reliab. 46(9-11): 1812-1816 (2006)

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