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"The impact of interface/border defect on performance and reliability of ..."
Wen-Kuan Yeh et al. (2013)
- Wen-Kuan Yeh, Po-Ying Chen, Kwang-Jow Gan, Jer-Chyi Wang
, Chao-Sung Lai
:
The impact of interface/border defect on performance and reliability of high-k/metal-gate CMOSFET. Microelectron. Reliab. 53(2): 265-269 (2013)
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