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"VDMOSFET HEF degradation modelling considering turn-around phenomenon."
Xuerong Ye et al. (2018)
- Xuerong Ye, Cen Chen, Yixing Wang, L. Wang, Guofu Zhai:
VDMOSFET HEF degradation modelling considering turn-around phenomenon. Microelectron. Reliab. 80: 37-41 (2018)
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