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"Failure and degradation mechanisms of high-power white light emitting diodes."

Shih-Chun Yang et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.03.007

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/YangLWHCCLC10
Shih-Chun Yang, Pang Lin, Chien-Ping Wang, Sheng Bang Huang, Chiu-Ling Chen, Pei-Fang Chiang, An-Tse Lee, Mu-Tao Chu:
Failure and degradation mechanisms of high-power white light emitting diodes. Microelectron. Reliab. 50(7): 959-964 (2010)

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