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"Comparison of temperature sensitive electrical parameter based methods for ..."

Felix Wuest et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.124

access: closed

type: Journal Article

metadata version: 2023-09-23

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Felix Wuest, S. Trampert, S. Janzen, Stefan Straube, Martin Schneider-Ramelow:
Comparison of temperature sensitive electrical parameter based methods for junction temperature determination during accelerated aging of power electronics. Microelectron. Reliab. 88-90: 534-539 (2018)

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