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"Modelling of initial fast charge loss mechanism for logic embedded ..."

Jianfei Wu et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.06.090

access: closed

type: Journal Article

metadata version: 2023-12-21

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Jianfei Wu, Cong Li, Hongyi Wang, J. Li, Liming Zheng:
Modelling of initial fast charge loss mechanism for logic embedded non-volatile memories. Microelectron. Reliab. 76-77: 174-177 (2017)

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