"Activation energy of drain-current degradation in GaN HEMTs under ..."

Yufei Wu, Chia-Yu Chen, Jesús A. del Alamo (2014)

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DOI: 10.1016/J.MICROREL.2014.09.019

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yufei Wu, Chia-Yu Chen, Jesús A. del Alamo:
Activation energy of drain-current degradation in GaN HEMTs under high-power DC stress. Microelectron. Reliab. 54(12): 2668-2674 (2014)

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