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"Reliability results of HBTs with an InGaP emitter."

Charles S. Whitman (2006)

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DOI: 10.1016/J.MICROREL.2006.02.004

access: closed

type: Journal Article

metadata version: 2020-02-22

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Charles S. Whitman:
Reliability results of HBTs with an InGaP emitter. Microelectron. Reliab. 46(8): 1261-1271 (2006)

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