"Mechanism of breakdown voltage wavering in power MOSFET induced by silicon ..."

Yann Weber (2011)

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DOI: 10.1016/J.MICROREL.2011.07.040

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type: Journal Article

metadata version: 2020-02-22

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Yann Weber:
Mechanism of breakdown voltage wavering in power MOSFET induced by silicon crystalline defect. Microelectron. Reliab. 51(9-11): 1908-1912 (2011)

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