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"Real-time imaging of temperature distribution inside a power device under ..."

Akihiko Watanabe, R. Nagao, Ichiro Omura (2017)

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DOI: 10.1016/J.MICROREL.2017.06.092

access: closed

type: Journal Article

metadata version: 2020-02-22

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Akihiko Watanabe, R. Nagao, Ichiro Omura:
Real-time imaging of temperature distribution inside a power device under a power cycling test. Microelectron. Reliab. 76-77: 490-494 (2017)

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