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"Leakage current, active power, and delay analysis of dynamic dual ..."

Jinhui Wang et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.06.011

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jinhui Wang, Na Gong, Ligang Hou, Xiaohong Peng, Ramalingam Sridhar, Wuchen Wu:
Leakage current, active power, and delay analysis of dynamic dual V_t CMOS circuits under P-V-T fluctuations. Microelectron. Reliab. 51(9-11): 1498-1502 (2011)

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