"A process-variation-resilient methodology of circuit design by using ..."

You Wang et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.073

access: closed

type: Journal Article

metadata version: 2024-05-07

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You Wang, Hao Cai, Lirida A. B. Naviner, Xiaoxuan Zhao, Yue Zhang, Mariem Slimani, Jacques-Olivier Klein, Weisheng Zhao:
A process-variation-resilient methodology of circuit design by using asymmetrical forward body bias in 28 nm FDSOI. Microelectron. Reliab. 64: 26-30 (2016)

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