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"Prediction of cure induced warpage of micro-electronic products."

Jan de Vreugd et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.02.028

access: closed

type: Journal Article

metadata version: 2022-06-09

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Jan de Vreugd, Kaspar M. B. Jansen, Leo J. Ernst, C. Bohm:
Prediction of cure induced warpage of micro-electronic products. Microelectron. Reliab. 50(7): 910-916 (2010)

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