"Testing the effects of reflow on tantalum capacitors."

Johanna Virkki, Tomi Seppälä, Pasi Raumonen (2010)

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DOI: 10.1016/J.MICROREL.2010.07.055

access: closed

type: Journal Article

metadata version: 2020-02-22

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Johanna Virkki, Tomi Seppälä, Pasi Raumonen:
Testing the effects of reflow on tantalum capacitors. Microelectron. Reliab. 50(9-11): 1650-1653 (2010)

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