"Resistive bridge defect detection enhancement under parameter variations ..."

Hector Villacorta et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.04.001

access: closed

type: Journal Article

metadata version: 2021-10-14

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Hector Villacorta, Víctor H. Champac, Sebastià A. Bota, Jaume Segura:
Resistive bridge defect detection enhancement under parameter variations combining Low V_DD and body bias in a delay based test. Microelectron. Reliab. 52(11): 2799-2804 (2012)

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