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"Impact of bias condition on 1/f noise of dual-gate depletion type MOSFET ..."

Mirjana S. Videnovic-Misic, M. M. Jevtic (2008)

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DOI: 10.1016/J.MICROREL.2008.04.002

access: closed

type: Journal Article

metadata version: 2020-02-22

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Mirjana S. Videnovic-Misic, M. M. Jevtic:
Impact of bias condition on 1/f noise of dual-gate depletion type MOSFET in linear region and consequences for noise diagnostic application and modelling. Microelectron. Reliab. 48(7): 1008-1014 (2008)

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